From the 7th – 12th of September, 2025, the 17th Multinational Congress on Microscopy will be taking place in Portorož – more info at https://17mcm.si/

See you there!

A zoomable electron backscatter image of a CoFeNi High Entropy Alloy sample after electrochemical etching, acquired on our Verios G4 SEM. The sample was prepared by Barbara Ljubec Božiček.

A zoomable electron backscatter image of a Strontium Hexaferrite (SrFe₁₂O₁₉) pellet after sintering, acquired on our Verios G4 SEM. The sample was synthesized by Aleksander Učakar.